
说明 芯天上SS8050三极管采用大晶圆封装,与普通国产小芯片对比测试,耐电流能力突出。在室温(25°C Ib=90mA VDD=5V)下,其它品牌的普通国产小芯片经过测试持续1A电流老化测试时温度急剧上升,30分钟内即会烧坏。而芯天上的SS8050丝印Y1三极管表现优秀,在持续1A电流老化
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芯天上SS8050三极管采用大晶圆封装,与普通国产小芯片对比测试,耐电流能力突出。在室温(25°C Ib=90mA VDD=5V )下,其它品牌的普通国产小芯片经过测试持续1A电流老化测试时温度急剧上升,30分钟内即会烧坏。而芯天上的SS8050 丝印Y1三极管表现优秀,在持续1A电流老化测试时三极管温度仅60度,在持续1.5A大电流老化4小后,三极管温度80度。
**电流可达1.5A
**温度可达150°C
| Symbol | Parameter | Value | Unit |
| Vcbo | Collector-Base Voltage | 40 | V |
| Vceo | Collector-Emitter Voltage | 25 | V |
| Vebo | Emitter-Base Voltage | 5 | V |
| lc | Collector Current | 1.5 | A |
| Pc | Collector Power Dissipation | 300 | mW |
| Rqja | Thermal Resistance From Junction Io Ambient | 417 | °C7W |
| T, | Junction Temperature | 150 | °C |
| Tslg | Storage Temperature | -55〜+150 | °C |
| Parameter | Symbdpp | Test conditions | Min | Typ | Max | Unit |
| Collector*base breakdown voltage | V(BR)CBO | lc= 100pA, lE=0 | 40 | V | ||
| Collector-emitter breakdown voltage | V(BR)CEO | lc= 0.1mA, lB=0 | 25 | V | ||
| Emitter*base breakdown voltage | V(BR)EBO | lE=100pA, lc=0 | 5 | V | ||
| Collector cut-off current | IcBO | Vcb=40V, Ie=0 | 0.1 | ma | ||
| Collector cut-off current | IcEO | Vce=20V, Ie=0 | 0.1 | 卩A | ||
| Emitter cut-off current | Iebo | Veb= 5V, lc=0 | 0.1 | 卩A | ||
| DC current gain | hFE⑴ | Vce=1V, lc= 100mA | 120 | 400 | ||
| hFE(2) | Vce=1V, lc= 800mA | 40 | ||||
| Collector-emitter saturation voltage | VcE(sat) | lc=800mA, Ib= 80mA | 0.5 | V | ||
| Base-emitter saturation voltage | VbE(5) | lc=800mA, Ib= 80mA | 1.2 | V | ||
| Transition frequency | fT | Vce=10V, lc= 50mA f=30MHz | 100 | MHz |